4930 (v.2) X-Ray Diffraction 513

Area:	Department of Applied Physics
Credits:	12.5
Contact Hours:	3.0
The tuition pattern below provides details of the types of classes and their duration. This is to be used as a guide only. For more precise information please check your unit outline.
Lecture:	1 x 1 Hours Weekly
Practical:	1 x 1.5 Hours Weekly
Workshop:	1 x 8 Days Yearly
Prerequisite(s):	4924 (v.6) Structure of Materials 512 or any previous version
Syllabus:	Powder diffraction principles, practice and applications: crystallography, specimens, instrumentation, identification analysis and phase analysis. Rietveld analysis. Crystallography basics, including space groups. Diffraction science: single crystal diffraction. Simulation of single crystal intensities: calculating structure factors. Crystal structure data bases (ICSD data base). Instrumental: Specimen requirements and preparation. The Bragg-Brentano diffractometer: optical design/alignment. Operating conditions: choice of generator settings, x-ray tube, slits, detector settings and electronics. Data reduction. Absorption, information depth. Preferred orientation. Extinction. Stacking faults. Identification methods. Search/match analysis with the Powder Diffraction File. Phase Composition Analysis: Traditional single-peak and multi-peak methods for thick and thin samples, including the MNI method. Rietveld phase composition analysis. Rietveld Pattern Fitting: Rietveld analysis for crystal structure refinement, cell parameters, phase analysis, texture characterisation, strain analysis, crystallite size analysis. Other methods: Line broadening determination of crystallite size, strain and stacking faults. Texture assessment, crystallinity. Grazing.
To ensure that the most up-to-date information about unit references, texts and outcomes appears, they will be provided in your unit outline prior to commencement.
Field of Education:	010301 Physics
SOLT (Online) Definitions*:	Informational *Extent to which this unit or thesis utilises online information
Result Type:	Grade/Mark

Availability

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