305430 (v.1) Electron Microscopy 302

Area:	Department of Applied Physics
Credits:	12.5
Contact Hours:	2.0
The tuition pattern below provides details of the types of classes and their duration. This is to be used as a guide only. For more precise information please check your unit outline.
Workshop:	1 x 2 Hours Weekly
Prerequisite(s):	305415 (v.3) Physics 102 or any previous version
Syllabus:	Fundamental principles, interaction of electrons with solids, basic designs including scanning electron microscope (SEM), transmission electron microscope (TEM) and energy dispersive X-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - X-ray analysis, wavelength and energy dispersive spectrometers and X-ray mapping.
To ensure that the most up-to-date information about unit references, texts and outcomes appears, they will be provided in your unit outline prior to commencement.
Field of Education:	010301 Physics
SOLT (Online) Definitions*:	Not Online *Extent to which this unit or thesis utilises online information
Result Type:	Grade/Mark

Availability

Availability Information has not been provided by the respective School or Area. Prospective students should contact the School or Area listed above for further information.