305430 (v.1) Electron Microscopy 302
| Area: | Department of Applied Physics |
| Credits: | 12.5 |
| Contact Hours: | 2.0 |
| ** The tuition pattern below provides details of the types of classes and their duration. This is to be used as a guide only. For more precise information please check your unit outline. ** | |
| Workshop: | 1 x 2 Hours Weekly |
| Prerequisite(s): | 305415 (v.3) Physics 102 or any previous version |
| Syllabus: | Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - x-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping. |
| ** To ensure that the most up-to-date information about unit references, texts and outcomes appears, they will be provided in your unit outline prior to commencement. ** | |
| Field of Education: | 010301 Physics |
| Funding Cluster: | 08 - Engineering, Science, Surveying |
| SOLT (Online) Definitions*: | Not Online *Extent to which this unit or thesis utilises online information |
| Result Type: | Grade/Mark |
Availability |
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| Availability Information has not been provided by the respective School or Area. Prospective students should contact the School or Area listed above for further information. | |
Curtin University of Technology
Current as of: July 11, 2005
Curtin University of Technology, Perth CRICOS Provider Code 00301J
The Sydney Campus of Curtin University of Technology CRICOS Provider Code 02637B