4915 (v.5) Applied Crystallography 402
| Area: | Department of Applied Physics |
| Contact Hours: | 2.0 |
| Credits: | 25.0 |
| Lecture: | 2 x 1 Hours Weekly |
| Crystallography of ideal materials. Diffraction of radiation. Structure factor formalism. Fourier computation of scattering density. Defects and disorder in crystals. Characterisation by diffraction methods. Stress analysis of single crystal and polycrystalline materials. Rietveld and profile analysis methods for diffractograms. Neutron and synchrotron radiation studies. Characterisation of disordered materials. |
| Year | Location | Period | Internal | Area External | Central External | | 2003 | Bentley Campus | Semester 1 | Y | | | | 2003 | Bentley Campus | Semester 2 | Y | | | |
Current as of: October 30, 2003 13:11:55
CRICOS provider code 00301J
