305430 (v.1) Electron Microscopy 302
| Area: | Department of Applied Physics |
| Contact Hours: | 2.0 |
| Credits: | 12.5 |
| Workshop: | 1 x 2 Hours Weekly |
| Prerequisite(s): | 1744 (v.3) Structure of Matter 102 or any previous version
|
| Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - x-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping. |
| Year | Location | Period | Internal | Area External | Central External | | 2003 | Bentley Campus | Semester 2 | Y | | | |
Current as of: October 30, 2003 13:11:55
CRICOS provider code 00301J
