302739 (v.2) Applied Physics 402
| Area: | Department of Applied Physics |
| Contact Hours: | 4.0 |
| Credits: | 25.0 |
| Lecture: | 2 x 1 Hours Weekly |
| Other Requisite(s): | Admission: to the Physics honours program
|
| Probing Materials with Electrons - Imaging modes of the transmission and scanning electron microscopes, Lattice Imaging, Selected area diffraction patterns, Electrons loss spectroscopy. Rietveld Characterisation of Polycrystalline Biological Materials - diffraction studies, high-resolution synchrotron radiation. Nano-structured Materials - design concepts and strategies, processing methods, novel nanostructured microstructures and properties. Nanostructure Characterisation and Modelling using Small AngleScattering - fundamentals of small angle scattering (SAXS and SANS). |
| Year | Location | Period | Internal | Area External | Central External | | 2003 | Bentley Campus | Semester 2 | Y | | | |
Current as of: October 30, 2003 13:11:55
CRICOS provider code 00301J
