305430 (v.1) Electron Microscopy 302

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Area:	Department of Applied Physics
Credits:	12.5
Contact Hours:	2.0
Workshop:	1 x 2 Hours Weekly
Prerequisite(s):	1744 (v.3) Structure of Matter 102 or any previous version
Syllabus:	Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - x-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping.
Unit Outcomes:	Perform basic electron microscopy operations including loading of samples, basic setup and calibrations, sample manipulation, acquisition of images and interpretation of relevant data. Prepares appropriate samples relative to experimental requirements. Contribute and participate in collaborative research including enhancing teamwork and cooperative learning skills. Development of literature research, scientific data analysis and written reporting skills. Preparation an presentation a folio of electron optical or related images or data together with relevant interpretations.
Text and references listed above are for your information only and current as of September 30, 2003. Please check with the unit coordinator for up-to-date information.
Unit References:	Topical research papers from the literature.
Unit Texts:	William, D. and Carter, C. (1996) Transmission Electron Microscopy-basics I, New York, Plenum Press. Goldstein, J. Newury, D. Echlin, P. Joy, D. Fiore, C. and Lifshin, E. (1981) Scanning Electron Microscopy and X-ray Microanalysis, New York, Plenum Press.
Unit Assessment Breakdown:	Assignments 20%, Examination 50%, Portfolio 30%. This is by grade/mark assessment.