305424 (v.1) Electron Microscopy 301
| Area: | Department of Applied Physics |
| Credits: | 25.0 |
| Contact Hours: | 4.0 |
| Workshop: | 1 x 4 Hours Weekly |
| Prerequisite(s): | 1744 (v.3) Structure of Matter 102 or any previous version
|
| Syllabus: | Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing. X-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping. |
| |
| Unit Outcomes: | On successful completion of this unit students will be able to describe the function and location of components of both SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing. X-ray analysis, wavelength and energy dispersive spetrometers, x-ray mapping. |
| Text and references listed above are for your information only and current as of September 30, 2003. Please check with the unit coordinator for up-to-date information. |
| Unit References: | No prescribed references. |
| Unit Texts: | No prescribed text. |
| |
| Unit Assessment Breakdown: | TEM and SEM Portfolio 40%. Assignments 10%. Final Examination 50%. This is by grade/mark assessment. |
| Year | Location | Period | Internal | Area External | Central External | | 2004 | Bentley Campus | Semester 1 | Y | | | |
Current as of: February 2, 2004
CRICOS provider code 00301J
