304063 (v.1) Applied Crystallography 601
| Area: | Department of Applied Physics |
| Credits: | 25.0 |
| Contact Hours: | 4.0 |
| Lecture: | 2 x 2 Hours Weekly |
| Syllabus: | Crystallography of ideal materials. Diffraction of radiation. Structure factor formalism. Fourier computation of scattering density. Defects and disorder in crystals. Characterisation by diffraction methods. Stress analysis of single crystal and polycrystalline materials. Rietveld and profile analysis methods for diffractograms. Neutron and synchrotron radiation studies. Characterisation of disordered materials. |
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| Unit Outcomes: | To be advised. |
| Text and references listed above are for your information only and current as of September 30, 2003. Please check with the unit coordinator for up-to-date information. |
| Unit References: | To be advised. |
| Unit Texts: | To be advised. |
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| Unit Assessment Breakdown: | To be advised. |
Current as of: February 2, 2004
CRICOS provider code 00301J
