302739 (v.2) Applied Physics 402

---

 

Area:	Department of Applied Physics
Credits:	25.0
Contact Hours:	4.0
Lecture:	2 x 1 Hours Weekly
Other Requisite(s):	Admission: to the Physics honours program
Syllabus:	Probing materials with electrons - imaging modes of the transmission and scanning electron microscopes, lattice imaging, selected area diffraction patterns, electrons loss spectroscopy. Rietveld characterisation of polycrystalline biological materials - diffraction studies, high-resolution synchrotron radiation. Nano-structured materials - design concepts and strategies, processing methods, novel nanostructured microstructures and properties. Nanostructure characterisation and modelling using Small Angle Scattering - fundamentals of small angle scattering (SAXS and SANS).
Unit Outcomes:	On successful completion of this unit students will be able to describe the structure of solid material at the nanometer level, appreciate how modelling methods are able to explain observed small angle scattering data, demonstrate an understanding of thetechniques used to characterise material at the atomic and nanometer level and explain and describe the terms used in the field of nanotechnology.
Text and references listed above are for your information only and current as of September 30, 2003. Please check with the unit coordinator for up-to-date information.
Unit References:	Glatter, O. and Kratky, O., 1982, 'Small Angle X-Ray Scattering', Academic Press, London. Windsor, C. G., 1981, 'Pulsed Neutron Scattering', Taylor and Francis, London. Feign, L. A. and Svergun, D. I., 1987, 'Structure Analysis by Small Angle X-Ray and Neutron Scattering', Plenum Press, New York. Brumberger, H., 1995, 'Modern Aspects of Small-Angle Scattering', Kluwer, Boston.
Unit Texts:	No prescribed text.
Unit Assessment Breakdown:	Assignments 80%. Final Examination 20%.
Year Location Period Internal Area External Central External 2004 Bentley Campus Semester 2 Y