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305430 (v.1) Electron Microscopy 302
Area: Department of Applied Physics Contact Hours: 2.0 Credits: 12.5 Workshop: 1 x 2 Hours Weekly Prerequisite(s): 1744 (v.3) Structure of Matter 102 or any previous version
Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - x-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping.
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