303988 (v.2) Applied Crystallography 502

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Area:	Department of Applied Physics
Contact Hours:	4.0
Credits:	25.0
Lecture:	2 x 2 Hours Weekly
Crystallography of ideal materials. Diffraction of radiation. Structure factor formalism. Fourier computation of scattering density. Defects and disorder in crystals. Characterisation by diffraction methods. Stress analysis of single crystal and polycrystalline materials. Rietveld and profile analysis methods for diffractograms. Neutron and synchrotron radiation studies. Characterisation of disordered materials. Data analysis and laboratory work.