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305430 (v.1) Electron Microscopy 302
Area: | Department of Applied Physics |
Contact Hours: | 2.0 |
Credits: | 12.5 |
Workshop: | 1 x 2 Hours Weekly |
Prerequisite(s): | 1744 (v.3) Structure of Matter 102 or any previous version
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| Fundamental principles, interaction of electrons with solids, basic designs including SEM, TEM, energy dispersive x-ray analysis. The advantages and disadvantages of different types of electron microscopes. Instrument setups and calibration. Sample preparation and operational modes, image analysis and signal processing - x-ray analysis, wavelength and energy dispersive spectrometers, x-ray mapping. |
Availability
| Year | Location | Period | Internal | Area External | Central External | | 2003 | Bentley Campus | Semester 2 | Y | | |
- Area External refers to external course/units run by the School or Department, offered online or through Web CT, or offered by research.
- Central External refers to external course/units run through the Curtin Bentley-based Distance Education Area. |
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