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303882 (v.1) Applied Crystallography 401



 

Area:

Department of Applied Physics

Contact Hours:

2.0

Credits:

25.0

Lecture:

1 x 2 Hours Weekly
Crystallography of ideal materials. Diffraction of radiation. Structure factor formalism. Fourier computation of scattering density. Defects and disorder in crystals. Characterisation by diffraction methods. Stress analysis of single crystal and polycrystalline materials. Rietveld and profile analysis methods for diffractograms. Neutron and synchrotron radiation studies. Characterisation of disordered materials.


Availability

Availability Information has not been provided by the respective School or Area. Prospective students should contact the School or Area listed above for further information.

 
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